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All our Silicon is monocrystalline. We offer three grades which include Standard Optical Grade, Mirror Grade, and EXT Grade. You can choose from three surface finishes, Standard, Fine and Superfine. Additional information on Physical and Optical properties, Material specifications, Shapes and Sizes, Tolerances, and Surface Quality are given below. |
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| Melting Point |
1414°C |
| Density |
2.329 g/cm3 |
| Thermal Expansion Coefficient |
2.6 x 10-6/K |
| Youngs Modulus <111> |
187 GPa |
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| Refractive Index |
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| Dn/dT |
1.56 x 10-4/°K @ 5.2µ |
| Transmission |
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| Purity |
> 99.999% |
| Crystal Structure |
Monocrystalline |
| Type/Dopant |
N/Phosphorous; P/Boron |
| Orientation |
<111>; <100> |
| Resistivity |
5.0 - 40 /cm |
| Standard Optical Grade |
> 10 /cm |
| Minor Grade |
1.0 - 10 /cm |
| EXT Grade |
> 50 /cm |
| EXT Grade has specific enhanced properties in transmission. |
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| Rods and Discs |
10 - 300 mm |
| Domes |
50 - 250 mm |
| Plano Optics |
10 - 300 mm; 200 x 200 mm |
| Lenses |
10 - 300 mm |
| Rectangular and other shapes |
200 x 200 mm; max. 300 mm diagonal |
| Witness samples and wedges |
25.4mm ; 1 - 10 mm thick |
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| Tolerances are diameter dependent, and they are based on 10mm minimum to 300mm maximum. Fabrication is according to DIN 286-2 (1990-11) and ASME Y14.5M 1994. Tighter tolerances are available upon request. |
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| Diameter |
± 0.2 mm to ± 1.5 mm |
| Thickness |
± 0.1 mm to ± 0.8 mm |
| Flatness |
± 30’ |
| Parallelism |
≤ 25 µm |
| Perpendicularity |
≤ 30 µm |
| Chamfer |
0.1 to 1.6 mm |
| ETV |
≤ 30 µm |
| Roundness |
≤ 30 µm |
| Length and Width |
± 0.05 mm |
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| As cut |
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| Standard |
D46 |
Rq = 2 μm max. |
| Fine |
D15 |
Rq = 0.8 μm max. |
| Superfine |
D7 |
Rq = 0.2μm max. |
| Polished |
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S/D: |
60/40 or better |
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Flatness: |
5 fringes |
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Irregularity: |
2 fringes |
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Parallelism: |
0.01 mm |
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Rq is defined as RMS deviation of all peaks/valleys to surface.
Polishing provided for filters and witness samples only. |
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| Full traceability according to MIL 130 Standard back to Melt / Lot |
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[1] Taken from NIST Database
[2] Measured by Photonic Sense |
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