Product data sheet of our Germanium [Printer-Friendly]
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| Physical Properties |
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| Melting Point |
938.25oC |
| Density |
5.323 g/cm3 |
| Thermal Expansion Coefficient |
5.7 x 10-6/K |
| Youngs Modulus <111> |
155.6 GPa |
| Modulus of Rupture |
72.4 MPa |
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| Optical Properties |
| Refractive Index |
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| Dn/dT |
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4.14 x 10-4/°K @ 5.2µ |
| Transmission |
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| Purity |
> 99.999% |
| Crystal Structure |
Monocrystalline & Polycrystalline |
| Type/Dopant |
N/Antimony; P/Boron |
| Orientation |
<111> |
| Resistivity |
0.5 - 40 /cm |
| Standard Optical Grade |
5.0 - 40 /cm |
| EXPT Grade |
0.5 - 5.0 /cm |
| EXPT Grade has specific enhanced properties for applications where electromagnetic shielding is required. |
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| Rods and Discs |
10 - 500 mm |
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| Plano Optics |
10 - 500 mm; 350 x 350 mm |
| Lenses |
10 - 500 mm |
| Rectangular and other shapes |
350 x 350 mm; max. 500 mm diagonal |
| Witness samples and wedges |
25.4 mm ; 1 - 10 mm thick |
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| Tolerances are diameter dependent , and they are based on a 10 mm minimum to 500 mm maximum. Fabrication is according to DIN 286-2 (1990-11) and ASME Y14.5M 1994. Tighter tolerances are available upon request. |
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| Diameter |
± 0.2 mm to ± 1.5 mm |
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| Thickness |
± 0.1 mm to ± 0.8 mm |
| Flatness |
± 30’ |
| Parallelism |
≤ 25 µm |
| Perpendicularity |
≤ 30 µm |
| Chamfer |
0.1 to 1.6 mm |
| ETV |
≤ 30 µm |
| Roundness |
≤ 30 µm |
| Length and Width |
± 0.05 mm |
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| As cut |
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| Standard |
D46 |
Rq = 2 μm max. |
| Fine |
D15 |
Rq = 0.8 μm max. |
| Superfine |
D7 |
Rq = 0.2μm max. |
| Polished |
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S/D: |
60/40 or better |
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Flatness: |
5 fringes |
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Irregularity: |
2 fringes |
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Parallelism: |
0.01 mm |
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Rq is defined as RMS deviation of all peaks/valleys to surface.
Polishing provided for filters and witness samples only. |
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| Full traceability according to MIL 130 Standard back to Melt / Lot |
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[1] Taken from NIST Database
[2] Measured by Photonic Sense |
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